A Multiple Fault Diagnosis Method Based on a Single Fault Simulation
نویسندگان
چکیده
With the increasing complexity of VLSI devices, more complex faults have appeared. Most of previous fault diagnosis methods considered a single defect assumption. However, for present technologies and chip sizes, defects have tendency to be clustered. So, we propose a multiple fault diagnosis method using a fault selection table. The proposed method can diagnose multiple defects based on a single fault simulation. In spite of a multiple fault diagnosis, the number of candidate faults is drastically reduced. Experimental results for ISCAS85 and full-scan version of ISCAS89 benchmark circuits prove the efficiency of the proposed method.
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